MTS Wafer Sort / Wafer Prober Solution – WPH from 8.3 wafers to 14 wafers per day

Semiconductor Manufacturing have EVOLVED, driven by a cycle of continuous improvement in technology. In Wafer Level testing, Wafer Sort or Wafer Prober what ever they call it, Testing Engineers encounter a lot issues in daily basis. MTS have co-work with the No.1 OSAT in the world to Identify and Resolve all of factors that cause “Lost of Productivity” or “Loss of Throughput”, thus results to higher 1st Pass Yield and Zero Downtime and High Throughput (WPD- wafer per day). Huge savings from prevented unnecessary New CAPEX investments.

Factors like:

1. Tester Reliability – Channel boards, Probe cards, Harmonic Interference
2. Prober/ Sorter Reliability – machine accuracy

MTS Solution; Focus “Time is money”

1. MTBF – MTS Zero Jam/ Zero Downtime Solution
2. MTBA – MTS Zero Alarm Solution
3. Retest rate <1% - MTS _1st Pass Yield = Final Yield Solution